General Purpose Electronic Test Equipment Parts

(Page 9) End item NSN parts page 9 of 45
Part Number
NSN
NIIN
1502B-03-04 MOD NB Time Domain Reflectometer
012844833
1502B-03-04MODNB Time Domain Reflectometer
012844833
1502C-03-04 Electrical Cable Test Set
013452121
1503 Metallic Time Doma Reflectometer
010367821
1503-01-04 Electrical Cable Test Set
011452801
1520A Sweep Generator
001067453
1521B Oscillograph
011411808
1531AB Digital Reado Electronic Counter
009116368
15510PT10N20 Oscilloscope
002282201
1551A OPTION 021 Oscilloscope
002282201
1551A-021 Oscilloscope
002282201
1606E-N Signal Generator
011543806
1608-9801 Impedance Bridge
009028687
160A Q-meter
001517787
1610B Electronic Digital Data Analyzer
011351632
1611B Capacitance Bridge
000597773
162 Waveform Generator
007124981
1620A Capacitance Bridge
012493369
163-5310 Test Lead
001726612
1631D Spectrum Analyzer
012277233
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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