رقم الجزء 2000B

Semiconductor Device Test Set

الأسعار والتوافر

أرسل هذا النموذج لمعرفة الأسعار الحالية وتوافر NSN هذا.
رقم الجزء:
كم:
عنوان البريد الإلكتروني:
الهاتف:
مرجع:
شركة:
اسم:

نحن لا نشارك أو نبيع معلوماتك لأي شخص.
الخصوصيه | حيث

All major credit cards accepted as well as gov. p-cards

التسعير التاريخي لهذا المنتج هو بين 2348 and 3169.8 USD. اعتمادا على الكمية والتوافر والحالة والمهلة الزمنية والتوقف المحتمل للعنصر ، لا يمكننا ضمان التسعير حتى نقدم لك عرض أسعار محدث.

رقم الجزء
تجريد
صلاحيه
UOM
NIIN
رقم الجزء:
2000b
تجريد:
No
صلاحيه:
N/A
وحدة القياس:
No qup EA
NIIN:
013914404

معلومات الجزء
Items are being coded as critical to insure source inspection will be performed at the point of manufacture, prior to material receipt by the us navy or other dod components. These items are piece parts or end items in support of vital military hardware necessary to sustain the successful mission of the ships, submarines, and shore stations of the us navy. Critical features including, but not limited to, dimensions, tolerances/clearances, electronic characteristics, and metallurgical properties will bespecified for government q ar (quality assurance representatives) to insure the highest possible degree of quality and reliability of these parts being delivered under navicp contracts

NSN
رقم المخزون الوطني:
6625-01-391-4404 6625013914404
TXT
وصف:
Semiconductor Device Test Set
INC
INC
رمز اسم العنصر:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
9.000 inches
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
11.000 inches
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
Gpete program
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Test signal frequency
MRC:
The master requirement codes of those requirements which are technically critical by reason of tolerance,fit,performance,or other characteristics which affect identification of the item.CRTL
Criticality Code Justification:
Feat
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
4.000 inches

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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