رقم الجزء 2500

Semiconductor Device Test Set

الأسعار والتوافر

أرسل هذا النموذج لمعرفة الأسعار الحالية وتوافر NSN هذا.
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رقم الجزء
تجريد
صلاحيه
UOM
NIIN
رقم الجزء:
2500
تجريد:
No
صلاحيه:
N/A
وحدة القياس:
1 EA
NIIN:
012012881

معلومات الجزء
Programmable pulse network

NSN
رقم المخزون الوطني:
6625-01-201-2881 6625012012881
TXT
وصف:
Semiconductor Device Test Set
INC
INC
رمز اسم العنصر:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
14.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
110.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
24.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Electrostatic discharge
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
10.000 inches
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Shipping weight 18 lbs.; 0-15, 000v continuously adjustable high voltage; 4-1/2 digit display; 1-128 pins; 1-99 auto pulses

{lang[cimilar]} Semiconductor Device Test Sets

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