رقم الجزء 259C

Semiconductor Device Test Set

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رقم الجزء
تجريد
صلاحيه
UOM
NIIN
رقم الجزء:
259c
تجريد:
Yes - DEMIL/MLI
صلاحيه:
وحدة القياس:
NIIN:
010869639
NSN
رقم المخزون الوطني:
6625-01-086-9639 6625010869639
TXT
وصف:
Semiconductor Device Test Set
INC
INC
رمز اسم العنصر:
25006
INC
COM
امتثال:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
6.500 inches
MRC:
A measurement of the smallest dimension of an item,in distinction from length or width.ABNM
Thickness:
4.500 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
7.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Self-contained
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Plastic carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Beta of transistor; forward tranductance of field-effect transistor; resistance of transistor or diode; shorted diode; open diode

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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