رقم الجزء 4010-01-M

Semiconductor Device Test Set

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All major credit cards accepted as well as gov. p-cards

التسعير التاريخي لهذا المنتج هو بين 1884.34 and 2543.859 USD. اعتمادا على الكمية والتوافر والحالة والمهلة الزمنية والتوقف المحتمل للعنصر ، لا يمكننا ضمان التسعير حتى نقدم لك عرض أسعار محدث.

رقم الجزء
تجريد
صلاحيه
UOM
NIIN
رقم الجزء:
4010-01-m
تجريد:
Yes - DEMIL/MLI
صلاحيه:
N/A
وحدة القياس:
1 EA
NIIN:
014373642

معلومات الجزء
Requested name surge protector test set

NSN
رقم المخزون الوطني:
6625-01-437-3642 6625014373642
TXT
وصف:
Semiconductor Device Test Set
INC
INC
رمز اسم العنصر:
25006
INC
COM
امتثال:
* ITAR Controlled
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Protector test set; leads
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Provides the capability to evaluate the terminal protection devices used on digital logic signal lines
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Open circuit voltage rate of rise 200 v/s, 1000v/s; max output voltage 1000 v; usable measuring range 0-1000 v; test current for solid state protectors 1 milliamp porm 10 pct; test current for gas tubes greater than 1 amp, less than 20 milliamp
MRC:
Literature and references available for information pertaining to the item.RDAL
Reference Data And Literature:
Serd462
MRC:
Indicates the relationship,such as construction,capabilities,and the like,of the item to a similar item.RTSE
Relationship To Similar Equipment:
Gsimilar to joslyn surge protector test set 4010-01 with usable measuring range of 10-1000 v; p/n 4010-01-m uses select components and an additional calibration step to support measurements of 0-1000 v

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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