رقم الجزء
تجريد
صلاحيه
UOM
NIIN
TXT
وصف:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
7.500 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 110.0 volts and 130.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
6.000 inches
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Beta gain; field effect
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Transistor bi-polar testing beta range from low power of 1 to high power of 500 and field effect transistor mutual conductance range from 0 to 50000 micromhos
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
9.500 inches
